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Real-time monitoring of steady-state pulsed chemical beam epitaxy by p-polarized reflectanceBACHMANN, K. J; SUKIDI, N; HÖPFER, C et al.Journal of crystal growth. 1998, Vol 183, Num 3, pp 323-337, issn 0022-0248Article

Feedback control methodologies for nonlinear systemsBEELER, S. C; IRAN, H. T; BANKS, H. T et al.Journal of optimization theory and applications. 2000, Vol 107, Num 1, pp 1-33, issn 0022-3239Article

Surface reaction kinetics of Ga1-xInxP growth during pulsed chemical beam epitaxyDIETZ, N; BEELER, S. C; SCHMIDT, J. W et al.Applied surface science. 2001, Vol 178, Num 1-4, pp 63-74, issn 0169-4332Article

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